Michael S. Hsiao is currently a Professor in
The Bradley Department of Electrical and
Computer Engineering at Virginia Tech.
He received his B.S.
in Computer Engineering, M.S. and Ph.D. in Electrical Engineering, all
from the University of Illinois at
Urbana-Champaign. He had held positions at
Digital Equipment Corporation,
National Semiconductor Corporation,
NEC USA, Intel Corp., and
Rutgers University.
He is a Fellow of the IEEE and a recepient of the National Science Foundation Faculty Early Career
Development (CAREER) Award.
His current research interests include
architectural-level and gate-level automatic test pattern generation (ATPG),
design verification and diagnosis,
fault simulation and defect coverage evaluation,
design for testability (DFT),
test set compaction,
power estimation and management in VLSI,
computer architecture,
parallelization, and
reliability. These areas have application domains in
chip design, embedded software, cognitive radios, finger print matching, and beyond.
Honors
- Virginia Cooperative Extension 2022 Educational Technology Award, State Winner, 2022.
- Virginia Tech W. S. "Pete" White Chair for Innovation in Engineering Education
- Virginia Cooperative Extension 2018 Program Excellence Award, State and Central District Winner
- Fellow, IEEE
- Best student paper award (best paper with student as primary author), 2012 IEEE International Test Conference
- Best paper award, 2010 IEEE Asian Test Symposium
- Most influential papers of 10 years (1998-2007) of Design Automation and Test in Europe (DATE) Conference
- Virginia Tech Dean's Faculty Fellow
- National Science Foundation Faculty Early Career Development (CAREER) Award
- Digital Equipment Corporation Fellowship
- McDonnell Douglas Scholarship
- Highest Graduating Honors
Editorships
- Associate Editor, IEEE Transactions on Computers
- Associate Editor, ACM Transactions on Design Automation of Electronic Systems
- Editorial Board, IEEE Design & Test of Computers
- Editorial Board, Springer Journal of Electronic Testing: Theory and Applications
Research
-
-
Publications
- People
- Recent Research Highlights
- Natural language based programming
- Utilizing swarm intelligence to achieve high coverage in test and verification
- On detecting and isolating hardware malicious insertions
- Intelligent simulation for design validation via partitioning and abstraction
- Deductive and inductive learning methods for bounded model checking, sequential equivalence, and induction
- Effective trace signal identification in post-silicon validation
- New fast methods for fault collapsing to unprecedented small fault sets
- Using ATPG to formal verification without exponential time
- New QBF solver using resolution and ZBDDs
- Fast untestable stuck-at, bridging, and transition fault identification
- New path-delay and transition fault model and testing
- Reduce yield-loss by avoiding functionally impossible transitions
- Test data volume and test application time reduction for transition tests
- Spectral methods for sequential circuit testing
- Fast fault and error diagnosis using region-based model
- Architectural level power management
Teaching
- Courses Taught in Recent Years
- Other Courses Taught in the Past
Information for Students
Information for those interested in Graduate Research Assistantship.
ECE Department