Welcome To The ECE 5505 Home Page
Testing of Digital Systems
- INSTRUCTOR:
Michael Hsiao
- PREREQUISITES:
- Logic Design
- Data Structures and Algorithms
- Basic Knowledge of CMOS
- OPTIONAL TEXT:
- VLSI Test Principles and Architectures by Wang, Wu, and Wen, Morgan Kaufmann.
- Digital Systems Testing and Testable Design by Abramovici, Breuer, and Friedman, IEEE.
- COURSE OBJECTIVES:
To address fundamental testing issues, problems, and solutions in
digital circuits and systems.
- LECTURE OUTLINE:
- Introduction & Testing Concepts(1.5 lectures)
- Logic Simulation Techniques (1.5 lectures)
- Fault Modeling (2 lectures)
- Fault Simulation and Coverage Estimation (3 lectures)
- ATPG for Stuck-at Faults, combinational and sequential (4.5 lectures)
- Test set compaction (1.5 lectures)
- Untestable Fault Identification (1 lecture)
- ATPG for Non-Traditional Faults (3 lectures)
- Design For Testability and BIST (3 lectures)
- Memory & SOC Testing (1 lecture)
- Diagnosis (2 lectures)
- Mixed Signal Test (1 lecture)
- Project Presentations (1 lecture)
- Exams (1 lecture)
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